| http://www.w3.org/ns/prov#value | - FIG. 8 is an example of a circuit (included in circuit 29 of chip 103 of FIG. 2, except for elements 14B, 352, and 353 thereof which are included in circuit 17A of chip 103 as shown in FIG. 4) for entering and executing test mode operations, and for implementing a preferred embodiment of the present invention.
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