About: http://webisa.webdatacommons.org/438759382

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	FIG. 5 is a timing chart showing a comparing operation of a comparison circuit provided in the semiconductor memory testing device according to the first embodiment of the present invention;
http://www.w3.org/ns/prov#wasQuotedFrom	google.com