About: http://webisa.webdatacommons.org/442929331

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Furthermore, in the embodiment, a burn-in test is conducted with respect to a semiconductor wafer 12, unlike a conventional burn-in test which is performed with respect to a packaged semiconductor device.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com