| http://www.w3.org/ns/prov#value | - age.As shown in FIG. 19, a known test socket for use in testing an electronic device, such as an IC or a bare chip, or a semiconductor package, comprises a contact 1 which is formed by means of punching a member having the property of a spring into a predetermined shape, and a housing 11 which fixedly retains the contact 1 and is formed from an insulating material.
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