About: http://webisa.webdatacommons.org/451269287

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	In the semiconductor memory device of FIG. 19A, a multi-bit test mode is available for reducing test time.
http://www.w3.org/ns/prov#wasQuotedFrom	google.fr