About: http://webisa.webdatacommons.org/45149884

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Complete optical characterization of thin films and their systems requires determining all parameters, including defects.
http://www.w3.org/ns/prov#wasQuotedFrom	spie.org