About: http://webisa.webdatacommons.org/452831990

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Through methods such as interferometry and ellipsometry, the thickness of the material layer may be calculated from the light intensity data measured by the photodetector.
http://www.w3.org/ns/prov#wasQuotedFrom	faqs.org