| http://www.w3.org/ns/prov#value | - According to the method, the automatic test environment is set up, and there is performed a repetitive measurement of at least one electrical quantity representative of an integrated circuit response to a set of...http://www.google.com/patents/US20020198674?utm_source=gb-gplus-sharePatent US20020198674 - Method for testing integrated circuitsAdvanced Patent SearchPublication numberUS20020198674 A1
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