PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The gate dielectric 244 may be formed by thermal oxidation, thermal oxidation followed by nitridation, chemical vapor deposition, sputtering, or other techniques known and used in the art for forming transistor gate dielectrics.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com.au