About: http://webisa.webdatacommons.org/52675259

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The present invention relates to a method of testing reliability of a semiconductor device and circuit, and particularly to a method of performing a non-destructive rapid test on negative bias temperature instability (NBTI) of a pMOSFET.
http://www.w3.org/ns/prov#wasQuotedFrom	freshpatents.com