PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The present invention relates to a substrate processing system and substrate processing method suitable for a technique which performs patterning a plurality of times on a target film disposed on a substrate, such as a semiconductor wafer.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.es