PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • In addition the development of advanced dry etching tools and processes have allowed the sub-micron images in overlying, masking photoresist shapes to be successfully transferred to underlying materials, such as insulator and conductive layers, used for the fabrication of the semiconductor devices.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com