| http://www.w3.org/ns/prov#value | - In the example shown in FIG. 31, internal write data for test operation is generated based on the data applied to 8 data input/output pins, that is, data input/output terminals DQ0, DQ4, DQ8, DQ12, DQ16, DQ20, DQ24 and DQ28, among data input/output terminals DQ0 to DQ31.
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