PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The CMP process mainly involves holding a semiconductor wafer against arotating polishing pad surface wetted by a polishing slurry, which typically comprises an acidic or basic etching solution in combination with alumina or silica particles.
http://www.w3.org/ns/prov#wasQuotedFrom
  • patentgenius.com