PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • 20100188658HIGH RESOLUTION WAFER INSPECTION SYSTEM - A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength.
http://www.w3.org/ns/prov#wasQuotedFrom
  • faqs.org