PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Therefore, Si precipitation is a problem because it degrades the lithography process via surface roughness and it reduces interconnect reliability via stress-induced voiding.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com