About: http://webisa.webdatacommons.org/7944980

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The present invention relates to the manufacture and testing of integrated circuits; and more particularly to circuits to test integrated circuits such as EEPROMs or FLASH EPROMs for engineering and production purposes.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com