| http://www.w3.org/ns/prov#value | - for a plurality of discrete IC's each having their own bias circuritryUS5313158 *Jan 12, 1993May 17, 1994U.S. Philips CorporationTest system integrated on a substrate and a method for using such a test systemUS5446309 *May 28, 1993Aug 29, 1995Matsushita Electric Industrial Co., Ltd.Semiconductor device including a first chip having an active element and a second chip having a passive elementUS5502
|
