| http://www.w3.org/ns/prov#value | - BRIEF DESCRIPTION OF THE INVENTION [0012] A first aspect of the present invention is a method of testing a circuit having multiple elements, comprising the steps of: creating a plurality of faults representing the elements for testing the circuit; grouping the faults based on common attributes of the faults; creating a test pattern for each group of faults; and testing the circuit with the test pa
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