About: http://webisa.webdatacommons.org/8634151

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	This test structure 20 is capable of use, as is shown by FIG. 1 along with FIG. 2 to evaluate such conducting layers as diffused, polycrystalline silicon, or metal layers found in the manufacture of integrated circuits.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com