PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • FIG. 4 is a conceptual drawing for describing the characteristic of a mask 60 employed for manufacturing a semiconductor according to the present embodiment in order to reduce a dimensional difference between the gate electrodes 58.
http://www.w3.org/ns/prov#wasQuotedFrom
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