About: http://webisa.webdatacommons.org/90230594

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	In turn, this creates a manufacturing test environment that is extremely resource intensive and that significantly affects time-to-market, time-to-volume, and quality of an integrated circuit.
http://www.w3.org/ns/prov#wasQuotedFrom	google.de