PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • An aspect of the present invention may provide for a method for modifying a photomask pattern optimized for use in producing a pattern on a workpiece, such as a semiconductor wafer, drive head, optical component or other objects.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.es