PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The optimal flow ranges, pressure, rf power and magnetic field strength depend on a number of factors including the size of the chamber, the type of dielectric being etched, the type of underlying metal, wafer size and desired process results such as etch rate, uniformity and selectivity.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.es