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An Entity of Type : prov:Entity, within Data Space : webisa.webdatacommons.org associated with source dataset(s)

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  • A test circuit for a semiconductor integrated circuit according to claim 1, wherein each of said plurality of control means comprises a plurality of flip flops and a plurality of logical circuits for generating said control signal that indicates whether or not said test results are outputted to said outside based on said comparison result transferred from said corresponding comparison means and ou
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