| http://www.w3.org/ns/prov#value | - However, such tests do not reliably detect all possible faults, including faults associated with the memory, the addressing mechanism, and the overall functionality of the FIFO. Fault models and tests have been described in the literature for detecting faults in RAMs. In addition, U.S. Pat. No. 5,513,318 (hereinafter the '318 patent) to Ad.
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