PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The circuit structure can now be observed using the SEM or other methods to determine whether or not defects or problems have occurred in the manufacturing process.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com