| http://www.w3.org/ns/prov#value | - Another embodiment of the present invention is a method for determining the elements on a surface with high pressure mass spectrometry comprising the steps of pulsing an ion beam of at least about 2 KeV at grazing incidence of about 45??? to 80??? to impinge said surface and detecting direct recoiled ions with a mass spectrometer having a time-of-flight sector located at an elevation angle of abou
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