About: http://webisa.webdatacommons.org/375789706

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	When this procedure is repeated to measure resistance between various combinations of I/O ports, the path resistance between each tester I/O port and the wafer test point to which it is connected can be computed from the results.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com