PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The polishing machine of claim 2 wherein said semiconductor wafer has a material including silicon dioxide deposited upon it that must be abraded and polished to control a thickness of said material.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com