About: http://webisa.webdatacommons.org/123351933

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	As integrated circuitry device dimensions continue to shrink, problems such as short channel effects, source-drain punchthrough, and hot electron susceptibility become ever present, particularly in the deep sub-half-micron regime.
http://www.w3.org/ns/prov#wasQuotedFrom	google.es