PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The process as claimed in claim 1, wherein the Si-containing film is silicon and the substrate is a material having a high dielectric constant. 16.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com