About: http://webisa.webdatacommons.org/210338727

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	A machine vision method for inspecting a semiconductor device, including either a semiconductor die lead frame or a semiconductor surface, comprising the steps of
http://www.w3.org/ns/prov#wasQuotedFrom	google.com