| http://www.w3.org/ns/prov#value | - Serial sectioning, in which a three-dimensional model may be constructed from a series of slices, is possible with techniques such as atomic force microscopy and scanning electron microscopy (SEM), coupled with a focussed ion beam (FIB) workstation.The need for three-dimensional visualisation and analysis at high spatial resolution is likely to increase as nanoscience and nanotechnology become inc
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