About: http://webisa.webdatacommons.org/413487607

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films.
http://www.w3.org/ns/prov#wasQuotedFrom	wikipedia.org