PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Next, a planarization process such as CMP is performed to remove material of layer 920 above the layer 900, and then layer 900 is removed by a selective etch process, resulting in the structure illustrated in the cross-sectional view of FIG. 9C.
http://www.w3.org/ns/prov#wasQuotedFrom
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