About: http://webisa.webdatacommons.org/77562103

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Many of these tests are performed while ICs are still on wafer (before separation) When probes contact pads, tests are carried out to indicate short circuits and other faults.
http://www.w3.org/ns/prov#wasQuotedFrom	philosophyparadise.com