PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • First, referring to FIG. 6(a), a gate oxide 402 having a film thickness of 4 to 30 nm for example is formed on the surface of the P-type silicon substrate 401 by means of a thermal oxidation method.
http://www.w3.org/ns/prov#wasQuotedFrom
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