PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Then, planarization processes such as a chemical mechanical polishing (CMP) process may be applied on the substrate surface to remove the excess tungsten formation on the substrate surface, providing a substantially flat substrate surface preferable for the subsequent processing steps.
http://www.w3.org/ns/prov#wasQuotedFrom
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