| http://www.w3.org/ns/prov#value | - In one embodiment of the present invention, the one monolayer of passivating material is an oxide which is generated by placing the bulk semiconductor substrate wafer into a furnace set a predetermined temperature and a predetermined pressure; introducing dry oxygen into the furnace for predetermined time period to grow the one monolayer of oxide on the pore wall of each of the pores; and cooling
|
