| http://www.w3.org/ns/prov#value | - The present invention may be applied to other forms of analysis, for example Auger Rutherford back scattering, secondary ion mass spectroscopy, X-ray photon spectroscopy, X-ray fluorescence spectroscopy, Mass spectroscopy, ultra violet and infra red spectroscopy and any other analysis techniques where a measured profile of a sample, which could be any suitable physical object, not necessarily man-
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