PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The clock control patterns and scan test patterns are provided to the integrated circuited under test in such a way as to transmit the external clock source during capture mode as required by testing.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com