| http://www.w3.org/ns/prov#value | - A method for testing an IC chip using test data consisting of a plurality of test vectors, the method comprising the steps of:determining a plurality of test blocks, the test blocks each of which is a combination of at least one test vector among the test vectors and is repeated at least one time in the test data; setting a designation order of the test blocks for restoring the test data; restorin
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