PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • FIGS. 2-7 show cross-sections of a substrate during various process steps in manufacturing a semiconductor device, in particular FETs used in forming a CMOS device; according to the present invention.
http://www.w3.org/ns/prov#wasQuotedFrom
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