PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The present invention relates to a mechanism for heating a substrate, particularly to a mechanism for heating a substrate employed for thin film formation and thin film processing in a thin film-forming process such as CVD or sputtering of a semiconductors.
http://www.w3.org/ns/prov#wasQuotedFrom
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