PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • FIG. 7 is a graph of the measured ellipsometric parameter psi and the calculated (theoretical) ellipsometric parameter psi of the sample silicon substrate overlaid with a silicon dioxide film layer and a titanium nitride film layer.
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