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PrefixNamespace IRI
n5http://webisa.webdatacommons.org/concept/device_structure_of+
skoshttp://www.w3.org/2004/02/skos/core#
isachttp://webisa.webdatacommons.org/concept/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n4http://webisa.webdatacommons.org/concept/differential+
xsdhhttp://www.w3.org/2001/XMLSchema#
Subject Item
isac:_defect_
skos:broader
isac:test_structure_
Subject Item
isac:circuit_element_
skos:broader
isac:test_structure_
Subject Item
isac:test_signal_
skos:broader
isac:test_structure_
Subject Item
isac:semiconductor_substrate_
skos:broader
isac:test_structure_
Subject Item
isac:_component_
skos:broader
isac:test_structure_
Subject Item
isac:_device_
skos:broader
isac:test_structure_
Subject Item
isac:_error_
skos:broader
isac:test_structure_
Subject Item
isac:_module_
skos:broader
isac:test_structure_
Subject Item
isac:_pattern_
skos:broader
isac:test_structure_
Subject Item
isac:_result_
skos:broader
isac:test_structure_
Subject Item
isac:_structure_
skos:broader
isac:test_structure_
Subject Item
isac:_measurement_
skos:broader
isac:test_structure_
Subject Item
isac:_property_
skos:broader
isac:test_structure_
Subject Item
isac:_transistor_
skos:broader
isac:test_structure_
Subject Item
isac:_difference_
skos:broader
isac:test_structure_
Subject Item
isac:_test_
skos:broader
isac:test_structure_
Subject Item
isac:_location_
skos:broader
isac:test_structure_
Subject Item
isac:_part_
skos:broader
isac:test_structure_
Subject Item
isac:_time_
skos:broader
isac:test_structure_
Subject Item
isac:_heating_
skos:broader
isac:test_structure_
Subject Item
isac:test_site_
skos:broader
isac:test_structure_
Subject Item
isac:_probe_
skos:broader
isac:test_structure_
Subject Item
isac:_testing_
skos:broader
isac:test_structure_
Subject Item
isac:_follow_
skos:broader
isac:test_structure_
Subject Item
isac:_formed_
skos:broader
isac:test_structure_
Subject Item
isac:_wafer_
skos:broader
isac:test_structure_
Subject Item
isac:_provided_
skos:broader
isac:test_structure_
Subject Item
isac:_obtained_
skos:broader
isac:test_structure_
Subject Item
isac:semiconductor_circuit_
skos:broader
isac:test_structure_
Subject Item
isac:_fig_3
skos:broader
isac:test_structure_
Subject Item
isac:_layer_
skos:broader
isac:test_structure_
Subject Item
isac:manufacturing_process_
skos:broader
isac:test_structure_
Subject Item
isac:_fig_
skos:broader
isac:test_structure_
Subject Item
isac:_presented_
skos:broader
isac:test_structure_
Subject Item
isac:semiconductor_structure_
skos:broader
isac:test_structure_
Subject Item
isac:kerf_area_
skos:broader
isac:test_structure_
Subject Item
isac:test_structure_
skos:broader
isac:test_structure_
Subject Item
isac:_fig_13
skos:broader
isac:test_structure_
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n4:gain_cell_
skos:broader
isac:test_structure_
Subject Item
isac:_disclosed_
skos:broader
isac:test_structure_
Subject Item
isac:probe_pad_
skos:broader
isac:test_structure_
Subject Item
n5:fig
skos:broader
isac:test_structure_