About: test structure

Premodifier: test
Head noun: structure

Same concepts

Broader concepts

label	provenance	confidence
structure	isap:352953535	0.593500
dut	isap:487938045	0.446703
test structure	isap:352952990	0.344925
integrate circuit	isap:25743282	0.329810

Narrower concepts

label	provenance	confidence
differential gain cell	isap:286145178	0.607032
device structure of fig	isap:352952999	0.561304
probe pad	isap:261585443	0.466786
circuit element	isap:319538309	0.429321
semiconductor structure	isap:352953656	0.356830
test structure	isap:352952990	0.344925
transistor	isap:193426155	0.252066
semiconductor substrate	isap:353508074	0.232412
kerf area	isap:286538929	0.220766
manufacturing process	isap:317716301	0.204579
fig 13	isap:262698571	0.197737
test signal	isap:421494357	0.194877
heating	isap:316466619	0.176038
fig 3	isap:262698537	0.173227
test site	isap:286124025	0.146569
wafer	isap:336793958	0.121716
structure	isap:352953029	0.107546
presented	isap:351938773	0.105831
obtained	isap:183340986	0.102390
test	isap:289818717	0.095385
disclosed	isap:352444848	0.093391
provided	isap:182643943	0.092148
part	isap:289554343	0.090205
follow	isap:422802771	0.090121
difference	isap:193039573	0.089313
formed	isap:423354322	0.087201
pattern	isap:316659559	0.085593
defect	isap:421815723	0.085153
measurement	isap:278135994	0.083440
result	isap:419852653	0.080201
fig	isap:262698618	0.079513
time	isap:286138751	0.078750
probe	isap:335820113	0.078207
semiconductor circuit	isap:317755854	0.077766
layer	isap:337258150	0.075945
module	isap:424744017	0.075803
property	isap:182611401	0.075791
testing	isap:317375180	0.075678
component	isap:351094961	0.074911
device	isap:424849904	0.073774
location	isap:184567843	0.072320
error	isap:337029926	0.052947