PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The increase of the resist etch resistance is also desirable even at longer wavelengths e.g. 248 nm or 436 nm, since it allows the use of thinner resist films and thus smaller aspect ratios for high resolution patterning.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com