About: test circuit

Premodifier: test
Head noun: circuit

Same concepts

Broader concepts

label	provenance	confidence
circuit	isap:429707220	0.636357
ring oscillator	isap:243956050	0.607192
semiconductor memory device	isap:270972955	0.596507
test method	isap:272664356	0.494299
test circuit	isap:429707149	0.336302
test contact	isap:437773394	0.188091

Narrower concepts

label	provenance	confidence
shift register	isap:340527588	0.426207
test circuit	isap:429707149	0.336302
logic circuit	isap:429707474	0.292519
circuit	isap:429706983	0.283204
conductor	isap:25560619	0.226260
magnetometer	isap:110219481	0.222424
silicon substrate	isap:23888191	0.213757
figure 16	isap:440936675	0.210568
power	isap:226003994	0.187970
transistor	isap:219212877	0.184633
reset signal	isap:440742616	0.178414
test	isap:11610123	0.134241
plurality	isap:24544001	0.133416
fig 12	isap:236684411	0.126153
device under test	isap:445596046	0.105031
shown	isap:224025231	0.098678
performance	isap:138092137	0.098245
formed	isap:440287599	0.097251
actuated	isap:341501746	0.092818
provided	isap:340440094	0.085294
output	isap:440783381	0.084275
presented	isap:27544494	0.084170
membrane	isap:342184566	0.083505
input	isap:226839342	0.082865
chip	isap:10903117	0.082830
figure	isap:440936668	0.082663
testing	isap:429140667	0.082535
result	isap:446575636	0.079631
substrate	isap:23888199	0.079011
fpga	isap:10051462	0.078848
parameter	isap:27091113	0.078552
wafer	isap:231205597	0.068531
leakage	isap:430883185	0.068198
source	isap:448947860	0.064339
time	isap:2705615	0.063288
not	isap:232516430	0.059289